• DocumentCode
    3333671
  • Title

    Particle in cell modelling of the quantitative evolution of a pinched electron beam across the a-k gap of a self magnetic pinch diode

  • Author

    Martin, P.N. ; Threadgold, J.R.

  • Author_Institution
    Atomic Weapons Establ., Aldermaston, UK
  • fYear
    2010
  • fDate
    20-24 June 2010
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. Particle in Cell (PiC) simulations using the Large Scale Plasma (LSP) code of a Self Magnetic Pinch (SMP) diode have been carried out to investigate the electron beam conditions present in the SMP anode-cathode (a-k) gap. The probability distributions of radial charge, macro particle energy and macro particle velocity are described as a function of emission region and position across the a-k gap. The conclusions of these investigations are that the top surface of cathode contributes around 50% of the electron flow while the lower surface accounts for only around 5% with the remaining flow coming from the tapered cathode tip. The energy of the electron beam starts as a low energy peaked distribution at the start of the a-k gap and goes through a broad distribution to one with a high energy bias, retaining a low energy tail largely independent of emission site. The angles which the electrons have across the a-k gap follow distributions which show structure for the emission sites on the top half of the cathode with the quantitative change in angle now being obtainable as a function of position. For emission sites on the lower half of the cathode, and as a position across the a-k gap, the angle distribution data has a broad shape biased to low angle with no clearly observable peaks.
  • Keywords
    pinch effect; plasma diodes; plasma simulation; plasma transport processes; SMP anode-cathode gap; angle distribution data; electron beam energy; electron flow; emission region; large scale plasma code; low energy peaked distribution; macroparticle energy; macroparticle velocity; particle-in-cell simulation; pinched electron beam; radial charge probability distribution; self magnetic pinch diode; top cathode surface; Atomic beams; Atomic measurements; Cathodes; Diodes; Electron beams; Large-scale systems; Magnetosphere; Plasma simulation; Probability distribution; Weapons;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2010 Abstracts IEEE International Conference on
  • Conference_Location
    Norfolk, VA
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4244-5474-7
  • Electronic_ISBN
    0730-9244
  • Type

    conf

  • DOI
    10.1109/PLASMA.2010.5534255
  • Filename
    5534255