Advanced FTA technique addressing early un-balanced failures of modern commercial electronic devices

Specifics and criticality of unbalanced failures vs. full and parametric ones are outlined; typical examples related to diverse live applications are discussed. Failure dynamics and interactions are studied. Common basis of various failure classes is revealed; features are described, classification is substantiated. Joint FTA-FMECA methodology, which incorporates strengths of deterministic and probabilistic approaches, is applied. Application specific models, gates and graphs are developed and calculated based on failure physics. Practical advantages over traditional technique are presented.