DocumentCode
3333844
Title
ePlas code enhancements for short-pulse laser-matter interaction studies
Author
Mason, R. ; Ambrosiano, J. ; Atchison, W. ; Faehl, R. ; Henderson, D. ; Kirkpatrick, R. ; Barnes, D.
Author_Institution
Res. Applic. Corp., Los Alamos, NM, USA
fYear
2010
fDate
20-24 June 2010
Firstpage
1
Lastpage
1
Abstract
Summary form only given. We detail improvements to ePLAS, a 2D PIC/hybrid simulation model in use for Fast Ignition. The code can explore millimeter size target interactions over 0.5-11 ps durations. Its Implicit Moment structure smoothly treats transport through targets with densities ranging from highly compressed solids to near-vacuum - with cell sizes largely exceeding a Debye length and time steps well beyond the plasma period. The full complement of E- and 5-fields is now available in both Cartesian and cylindrical geometry via a new explicit treatment of B. The atomic Z can vary locally, as designated by either analytic Thomas-Fermi, or SESAME EOSs. Simulated K-alpha imaging is facilitated. A new joint-fluid and particle ion treatment enables superior fast ion interaction studies. The code runs efficiently on PCs. New versions exist for both the Linux and Mac OSX systems. Graphical output is now visible through the IDL Virtual Machine and free GDL. ePLAS is available for beta testing, generally w/o an export license.
Keywords
plasma density; plasma simulation; plasma transport processes; plasma-wall interactions; 2D PIC simulation model; Cartesian geometry; Debye length; GDL; IDL virtual machine; Linux system; Mac OSX system; cylindrical geometry; ePLAS code; high compressed solid density; hybrid simulation model; implicit moment structure; particle ion treatment; plasma period; short-pulse laser-matter interaction; simulated K-alpha imaging; superior fast ion interaction; Geometry; Ignition; Laser modes; Linux; Optical imaging; Personal communication networks; Plasma density; Plasma simulation; Plasma transport processes; Virtual machining;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 2010 Abstracts IEEE International Conference on
Conference_Location
Norfolk, VA
ISSN
0730-9244
Print_ISBN
978-1-4244-5474-7
Electronic_ISBN
0730-9244
Type
conf
DOI
10.1109/PLASMA.2010.5534268
Filename
5534268
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