DocumentCode :
3333896
Title :
High-selectivity reactive ion etching with CO/NH3/Xe gas for micro/nanostructuring of 20% Fe-Ni, Au, Pt, and Cu
Author :
Abe, Takashi ; Youn Gi Hong ; Esashi, Masayoshi
Author_Institution :
Graduate Sch. of Eng., Tohoku Univ., Sendai, Japan
fYear :
2003
fDate :
19-23 Jan. 2003
Firstpage :
574
Lastpage :
577
Abstract :
Highly selective etch process for conductive metals (Au, Pt, and Cu) and magnetic metal (20%Fe-Ni) has been developed on a magnetron reactive ion etching system which uses a CO/NH3/Xe chemistry. Etch selectivities of these metals to titanium greater than 80:1 for Au, 40:1 for Pt, 30:1 for Cu, and 15:1 for Permalloy (20%Fe-Ni) were achieved at a titanium etch rate of 1.0 nm/min. These etchings were carried out at a room temperature. We found out that a little addition of Xe to CO/NH3 gases (molar ratio=1/7) shows both ion assist etching of these metals and nitridation of titanium mask thus resulting in the good selectivity. These etch selectivities were enhanced about three times greater than that obtained without Xe.
Keywords :
Permalloy; copper; gold; iron alloys; nanotechnology; nickel alloys; platinum; sputter etching; surface hardening; titanium; 20%Fe-Ni; Au; CO-NH3-Xe; CO/NH3/Xe gas; Cu; Fe-Ni; Pt; Ti mask; etch selectivities; high-selectivity reactive ion etching; ion assist etching; magnetron reactive ion etching system; microstructuring; nanostructuring; nitridation; selectivity; Gold; Magnetic anisotropy; Magnetic materials; Magnetic sensors; Perpendicular magnetic anisotropy; Plasma applications; Plasma chemistry; Plasma temperature; Sputter etching; Titanium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2003. MEMS-03 Kyoto. IEEE The Sixteenth Annual International Conference on
ISSN :
1084-6999
Print_ISBN :
0-7803-7744-3
Type :
conf
DOI :
10.1109/MEMSYS.2003.1189814
Filename :
1189814
Link To Document :
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