• DocumentCode
    3333912
  • Title

    Infrared image enhancement based on an aligned high resolution visible image

  • Author

    Choi, Kyuha ; Kim, Changhyun ; Ra, Jong Beom

  • Author_Institution
    Dept. of Electr. Eng., KAIST, Daejeon, South Korea
  • fYear
    2010
  • fDate
    26-29 Sept. 2010
  • Firstpage
    3341
  • Lastpage
    3344
  • Abstract
    Since the visual quality of an infrared (IR) image is usually unsatisfactory due to blurred edges and lack of textures, it is sometimes hard to obtain sufficient information from the IR image. In this paper, we present a novel framework for the IR image enhancement with the help of its aligned high resolution visible image. In the algorithm, we first prepare an aligned pair of IR and visible images through multi-sensor image registration. We then define a weight map based on edge correspondence in order to properly transfer the sharp edge property in the visible image to the IR image while avoiding unwanted blurring and distortion. We enhance the IR edges with high weights by applying visible-image-driven anisotropic diffusion with adaptive diffusion parameters. Finally, we deblur the remaining area to obtain a result that is enhanced uniformly over the whole IR image. Experimental results show that the proposed method can provide quality-improved IR images.
  • Keywords
    edge detection; image enhancement; image fusion; image registration; image resolution; image restoration; image texture; infrared imaging; IR image; adaptive diffusion; aligned high resolution visible image; blurred edge; image texture; infrared image enhancement; multisensor image registration; sharp edge property; visible-image-driven anisotropic diffusion; visual quality; Anisotropic magnetoresistance; Image edge detection; Image enhancement; Image resolution; Kernel; Pixel; Sensors; IR image enhancement; anisotropic diffusion; deblurring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2010 17th IEEE International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-7992-4
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2010.5651482
  • Filename
    5651482