DocumentCode :
3334157
Title :
A fabrication process with high thermal isolation and vacuum sealed lead transfer for gas reactors and sampling microsystems
Author :
McNamara, Shamus ; Gianchandani, Yogesh B.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
fYear :
2003
fDate :
19-23 Jan. 2003
Firstpage :
646
Lastpage :
649
Abstract :
This paper describes a six-mask fabrication process for vacuum-sealed microsystems including pressure and flow sensors, reaction chambers and reservoirs, and channels ranging from 100 nm to 10 μm in hydraulic diameter. All structures are countersunk into a glass substrate, resulting in a planar upper surface that eliminates stress concentrations and also facilitates further lithographic processing. The material choices and structural arrangements are designed to. provide high thermal isolation (∼2 × 105 K/W). Lead transfer between the three available levels of interconnect are accomplished with minimal parasitic capacitance (< 1 fF), and low resistance (∼1 Ω). A variety of test structures have been successfully fabricated.
Keywords :
capacitance; microfluidics; micromechanical devices; microsensors; packaging; pressure sensors; 1 fF; 1 ohm; 100 nm to 10 micron; SiO2; fabrication process; flow sensors; gas reactors; high thermal isolation; interconnects; lithographic processing; pressure sensors; sampling microsystems; vacuum sealed lead transfer; vacuum-sealed microsystems; Fabrication; Glass; Hydraulic diameter; Inductors; Parasitic capacitance; Reservoirs; Sampling methods; Sensor phenomena and characterization; Thermal resistance; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2003. MEMS-03 Kyoto. IEEE The Sixteenth Annual International Conference on
ISSN :
1084-6999
Print_ISBN :
0-7803-7744-3
Type :
conf
DOI :
10.1109/MEMSYS.2003.1189832
Filename :
1189832
Link To Document :
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