• DocumentCode
    3334171
  • Title

    CMOS compatible high voltage compliant MESFET based analog IC building blocks

  • Author

    Kim, Sungho ; Lepkowski, William ; Thornton, Trevor J. ; Bakkaloglu, Bertan

  • Author_Institution
    Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
  • fYear
    2009
  • fDate
    2-5 Aug. 2009
  • Firstpage
    122
  • Lastpage
    125
  • Abstract
    MESFET devices provide high breakdown characteristics, enable high voltage operation, and direct battery hook-up with no changes in processing on state of the art SOI and SOS CMOS processes. Fundamental analog building blocks, including single-ended and differential amplifiers and high impedance current mirror were designed and fabricated in a single poly, 3-layer metal digital CMOS technology utilizing fully depletion mode MESFET devices. The measured breakdown voltage of the SOS MESFETS presented here has a breakdown voltage of over 7.5 V without causing irreversible damage. DC characteristics were measured by varying the power supply from 2.5 to 5.5 V. The measured DC transfer curves of amplifiers show good agreement with the simulated ones with extracted models from the same process. The accuracy of the current mirror showing inverse operation is within plusmn5% for the current from 0 to 1.5 mA with the power supply from 2.5 to 5.5 V.
  • Keywords
    CMOS analogue integrated circuits; CMOS digital integrated circuits; MESFET integrated circuits; silicon-on-insulator; 3-layer metal digital CMOS technology; DC transfer curve; SOI process; SOS CMOS processes; analog IC building block; breakdown voltage; complementary metal oxide semiconductor; current 0 mA to 1.5 mA; differential amplifier; direct battery hook-up; fully depletion mode MESFET devices; high voltage compliant MESFET; single-ended amplifier; voltage 2.5 V to 5.5 V; Analog integrated circuits; Batteries; Breakdown voltage; CMOS analog integrated circuits; CMOS integrated circuits; CMOS technology; MESFET integrated circuits; Mirrors; Power measurement; Power supplies;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2009. MWSCAS '09. 52nd IEEE International Midwest Symposium on
  • Conference_Location
    Cancun
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4244-4479-3
  • Electronic_ISBN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2009.5236136
  • Filename
    5236136