DocumentCode :
3334180
Title :
2006 IEEE Radiation Effects Data Workshop
fYear :
2006
fDate :
38899
Abstract :
The following topics are dealt with: radiation effects, single event transients; aerospace electronics, MOSFET devices, CMOS integrated circuits, SRAM chips and field programmable gate arrays
Keywords :
CMOS integrated circuits; SRAM chips; field programmable gate arrays; radiation hardening (electronics); space vehicle electronics; CMOS integrated circuits; MOSFET devices; SRAM chips; aerospace electronics; field programmable gate arrays; radiation effects; single event transients;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation Effects Data Workshop, 2006 IEEE
Conference_Location :
Ponte Vedra, FL
Print_ISBN :
1-4244-0638-2
Type :
conf
DOI :
10.1109/REDW.2006.295455
Filename :
4077269
Link To Document :
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