DocumentCode
3334273
Title
The Soft Gamma-ray Detector for the ASTRO-H mission
Author
Tanaka, T. ; Blandford, R. ; Doutsu, K. ; Endo, T. ; Enoto, T. ; Fukazawa, Y. ; Fukami, K. ; Fukuyama, T. ; Hanabata, Y. ; Harayama, J. ; Hayashi, K. ; Hiragi, K. ; Ishikawa, S. ; Kataoka, J. ; Katsuta, J. ; Kitaguchi, T. ; Kokubun, M. ; Koseki, M. ; Kozu
Author_Institution
Kavli Inst. for Particle Astrophys. & Cosmol., Stanford Univ., Menlo Park, CA, USA
fYear
2009
fDate
Oct. 24 2009-Nov. 1 2009
Firstpage
2140
Lastpage
2144
Abstract
The Soft Gamma-ray Detector (SGD) on board ASTRO-H (Japanese next high-energy astrophysics mission) is a Compton telescope with narrow fleld-of-view, which utilizes Compton kinematics to enhance its background rejection capabilities. It is realized as a hybrid semiconductor detector system which consists of silicon and CdTe (cadmium telluride) detectors. It can detect photons in a wide energy band (50-600 keV) at a background level 10 times better than that of the Suzaku Hard X-ray Detector, and is complimentary to the Hard X-ray Imager on board ASTRO-H with an energy coverage of 5-80 keV. Excellent energy resolution is the key feature of the SGD, allowing it to achieve good background rejection capability taking advantage of good angular resolution. An additional capability of the SGD, its ability to measure gamma-ray polarization, opens up a new window to study properties of gamma-ray emission processes. Here we describe the instrument design of the SGD, its expected performance, and its development status.
Keywords
Compton effect; aerospace instrumentation; gamma-ray apparatus; gamma-ray detection; semiconductor counters; ASTRO-H mission; Compton kinematics; SGD; background rejection capability; cadmium telluride detectors; electron volt energy 50 keV to 600 keV; hard X-ray imager; hybrid semiconductor detector system; narrow FOV Compton telescope; silicon detectors; soft gamma-ray detector; Astrophysics; Cadmium compounds; Energy resolution; Gamma ray detectors; Kinematics; Silicon; Telescopes; X-ray detection; X-ray detectors; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location
Orlando, FL
ISSN
1095-7863
Print_ISBN
978-1-4244-3961-4
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2009.5402092
Filename
5402092
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