Title :
Compendium of Single Event Effects Results for Candidate Spacecraft Electronics for NASA
Author :
O´Bryan, Martha V. ; Poivey, Christian ; Kniffin, Scott D. ; Buchner, Stephen P. ; Ladbury, Ray L. ; Oldham, Timothy R. ; Howard, James W., Jr. ; LaBel, Kenneth A. ; Sanders, Anthony B. ; Berg, Melanie ; Marshall, Cheryl J. ; Marshall, Paul W. ; Kim, Hak
Author_Institution :
Goddard Space Flight Center, MEI Technol. Inc., Greenbelt, MD
Abstract :
Susceptibility of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include digital, linear bipolar, and hybrid devices
Keywords :
avionics; proton effects; radiation hardening (electronics); semiconductor devices; NASA; digital device; heavy ion single event effects; hybrid device; linear bipolar device; proton induced single event effects; spacecraft electronics; Aerospace electronics; Cyclotrons; Electronic equipment testing; NASA; Protons; Single event upset; Space technology; Space vehicles; Test facilities; USA Councils; Single Event Effects; digital; hybrid devices; linear bipolar; spacecraft electronics;
Conference_Titel :
Radiation Effects Data Workshop, 2006 IEEE
Conference_Location :
Ponte Vedra, FL
Print_ISBN :
1-4244-0638-2
DOI :
10.1109/REDW.2006.295463
