DocumentCode
3334325
Title
General and efficient multiple list traversal for concurrent fault simulation
Author
Montessoro, P.L. ; Gai, S.
Author_Institution
CENS/CNR, Politecnico di Torino, Italy
fYear
1991
fDate
1-2 Mar 1991
Firstpage
43
Lastpage
48
Abstract
Accuracy, generality and efficiency are critical factors when fault simulation of VLSI circuits is the target. The concurrent algorithm is the only solution when generality and accuracy is required. Its differential representation of the network status saves memory and CPU time, but due to its complexity the implementations grow in size and lose in performance as soon as higher abstraction levels are added beyond the gate one. In the paper the minimal information concept is discussed, and its applications to the key algorithms for concurrent event-driven simulation are shown. New advanced generalized techniques for multiple list traversal (MLT), trigger inhibition, fraternal event processing, list events, edge sensitive inputs, compile-driven evaluation functions, functional fault sources and clock suppression are presented for the first time in a truly unified context
Keywords
VLSI; circuit analysis computing; digital simulation; fault location; integrated circuit testing; logic testing; Creator; VLSI circuits; clock suppression; compile-driven evaluation functions; concurrent fault simulation; edge sensitive inputs; event-driven simulation; fraternal event processing; functional fault sources; list events; multiple list traversal; trigger inhibition; Central Processing Unit; Circuit faults; Circuit simulation; Clocks; Data structures; Discrete event simulation; Network topology; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI, 1991. Proceedings., First Great Lakes Symposium on
Conference_Location
Kalamazoo, MI
Print_ISBN
0-8186-2170-2
Type
conf
DOI
10.1109/GLSV.1991.143940
Filename
143940
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