Proton Radiation Test Results on COTS-Based Electronic Devices for NASA-Johnson Space Center Spaceflight Projects

Author

Kouba, Coy K. ; Nguyen, Kyson ; O´Neill, Patrick ; Bailey, Charles

Author_Institution

Avionic Syst. Div., NASA, Houston, TX

fYear

2006

fDate

38899

Firstpage

26

Lastpage

36

Abstract

This paper reports the results of recent single event effect (SEE) testing on a variety of commercial-off-the-shelf (COTS) based microelectronic hardware after exposure to 200 Mega-electron-volt (MeV) protons. This hardware was being evaluated for use in both Space Shuttle and International Space Station (ISS) applications. Our approach, test protocol and analysis methodology are discussed

Keywords

avionics; protons; radiation hardening (electronics); space research; space vehicles; 200 MeV; COTS electronic devices; International Space Station; Johnson Space Center; NASA; Space Shuttle; commercial-off-the-shelf; microelectronic hardware; proton radiation test results; single event effect testing; spaceflight projects; test protocol; Aerospace electronics; Electronic equipment testing; Electronic mail; Hardware; Low earth orbit satellites; NASA; Protocols; Protons; Space shuttles; USA Councils; Board-level; COTS; LEO; MTBF; SEE; SEU; latchup; proton;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation Effects Data Workshop, 2006 IEEE

Conference_Location

Ponte Vedra, FL

Print_ISBN

1-4244-0638-2

Type

conf

DOI

10.1109/REDW.2006.295464

Filename

4077278