Title :
Proton Radiation Test Results on COTS-Based Electronic Devices for NASA-Johnson Space Center Spaceflight Projects
Author :
Kouba, Coy K. ; Nguyen, Kyson ; O´Neill, Patrick ; Bailey, Charles
Author_Institution :
Avionic Syst. Div., NASA, Houston, TX
Abstract :
This paper reports the results of recent single event effect (SEE) testing on a variety of commercial-off-the-shelf (COTS) based microelectronic hardware after exposure to 200 Mega-electron-volt (MeV) protons. This hardware was being evaluated for use in both Space Shuttle and International Space Station (ISS) applications. Our approach, test protocol and analysis methodology are discussed
Keywords :
avionics; protons; radiation hardening (electronics); space research; space vehicles; 200 MeV; COTS electronic devices; International Space Station; Johnson Space Center; NASA; Space Shuttle; commercial-off-the-shelf; microelectronic hardware; proton radiation test results; single event effect testing; spaceflight projects; test protocol; Aerospace electronics; Electronic equipment testing; Electronic mail; Hardware; Low earth orbit satellites; NASA; Protocols; Protons; Space shuttles; USA Councils; Board-level; COTS; LEO; MTBF; SEE; SEU; latchup; proton;
Conference_Titel :
Radiation Effects Data Workshop, 2006 IEEE
Conference_Location :
Ponte Vedra, FL
Print_ISBN :
1-4244-0638-2
DOI :
10.1109/REDW.2006.295464
