Title :
Results of Single-Event Effects Measurements Conducted by the Jet Propulsion Laboratory
Author :
Irom, Farokh ; Miyahira, Tetsuo F.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
Abstract :
This paper reports recent single-event effects results for a variety of microelectronic devices that include an ADC, DAC, supervisory circuit, FIFO and a Viterbi decoder. The data was collected to evaluate these devices for possible use in NASA
Keywords :
Viterbi decoding; analogue-digital conversion; avionics; radiation hardening (electronics); reference circuits; ADC; DAC; FIFO; NASA; Viterbi decoder; heavy ion; jet propulsion laboratory; latchup; microelectronic devices; single-event effects measurements; supervisory circuit; Circuits; Cyclotrons; Ion beams; Laboratories; Power supplies; Propulsion; Single event upset; Space technology; Temperature; Testing; Cyclotron; Latchup; SEE; heavy ion;
Conference_Titel :
Radiation Effects Data Workshop, 2006 IEEE
Conference_Location :
Ponte Vedra, FL
Print_ISBN :
1-4244-0638-2
DOI :
10.1109/REDW.2006.295465
