DocumentCode
3334362
Title
Fault diagnosis in complex digital circuits
Author
Subramanian, Krishnan ; Billmers, Meyer ; Sitterly, Scott ; Baker, Paul
Author_Institution
Digitl Equipment Corp., Marlboro, MA, USA
fYear
1989
fDate
6-10 Mar 1989
Firstpage
159
Lastpage
164
Abstract
A methodology is presented for diagnosing faults in complex, evolving digital circuits. The authors believe, however, that the analysis and the methods described can be applied to diagnose faults in the generic flow circuit, namely, information networks, thermal circuits, etc. A model useful for fault diagnosis is developed, and its application to troubleshooting digital circuits is discussed. The method involves three key steps: a given complex circuit may have to be transformed to a simpler representation, to one that corresponds to the model; basic techniques identified using the model can then be applied to troubleshoot it; and appropriate extensions may be needed for additional domain-specific or circuit-specific fault handling. A system that implements the methodology has been developed, and has been used to successfully troubleshoot a candidate complex digital circuit (of about 5-10% of the complexity of a VAX CPU)
Keywords
circuit analysis computing; fault location; knowledge based systems; VAX CPU; complex digital circuits; fault diagnosis; fault handling; generic flow circuit; information networks; thermal circuits; troubleshooting; Artificial intelligence; Circuit faults; Circuit testing; Degradation; Digital circuits; Fault diagnosis; Information analysis; Trademarks; Uncertainty; Variable speed drives;
fLanguage
English
Publisher
ieee
Conference_Titel
Artificial Intelligence Applications, 1989. Proceedings., Fifth Conference on
Conference_Location
Miami, FL
Print_ISBN
0-8186-1902-3
Type
conf
DOI
10.1109/CAIA.1989.49149
Filename
49149
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