• DocumentCode
    3334362
  • Title

    Fault diagnosis in complex digital circuits

  • Author

    Subramanian, Krishnan ; Billmers, Meyer ; Sitterly, Scott ; Baker, Paul

  • Author_Institution
    Digitl Equipment Corp., Marlboro, MA, USA
  • fYear
    1989
  • fDate
    6-10 Mar 1989
  • Firstpage
    159
  • Lastpage
    164
  • Abstract
    A methodology is presented for diagnosing faults in complex, evolving digital circuits. The authors believe, however, that the analysis and the methods described can be applied to diagnose faults in the generic flow circuit, namely, information networks, thermal circuits, etc. A model useful for fault diagnosis is developed, and its application to troubleshooting digital circuits is discussed. The method involves three key steps: a given complex circuit may have to be transformed to a simpler representation, to one that corresponds to the model; basic techniques identified using the model can then be applied to troubleshoot it; and appropriate extensions may be needed for additional domain-specific or circuit-specific fault handling. A system that implements the methodology has been developed, and has been used to successfully troubleshoot a candidate complex digital circuit (of about 5-10% of the complexity of a VAX CPU)
  • Keywords
    circuit analysis computing; fault location; knowledge based systems; VAX CPU; complex digital circuits; fault diagnosis; fault handling; generic flow circuit; information networks; thermal circuits; troubleshooting; Artificial intelligence; Circuit faults; Circuit testing; Degradation; Digital circuits; Fault diagnosis; Information analysis; Trademarks; Uncertainty; Variable speed drives;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Artificial Intelligence Applications, 1989. Proceedings., Fifth Conference on
  • Conference_Location
    Miami, FL
  • Print_ISBN
    0-8186-1902-3
  • Type

    conf

  • DOI
    10.1109/CAIA.1989.49149
  • Filename
    49149