DocumentCode
3334383
Title
Single Event Effects on New High Speed Analog to Digital Converters, Digital to Analog Converters, Hybrid MUXDAC Devices, and Voltage Converters
Author
Esteban, A.J. ; Bogorad, A.L. ; Likar, J.J. ; Moyer, S.K. ; Herschitz, R.
Author_Institution
Specialty Eng., Lockheed Martin Commercial Space Syst., Newton, PA
fYear
2006
fDate
38899
Firstpage
43
Lastpage
49
Abstract
SEE testing of new devices revealed unexpected behavior that has potentially serious implications to spacecraft design. Previously unreported SET, SEFI, and clock upsets underscore the importance of testing in worst-case operating conditions representative of device applications
Keywords
analogue-digital conversion; avionics; convertors; digital-analogue conversion; multiplexing equipment; radiation hardening (electronics); SEFI; SET; analog to digital converters; clock upsets; digital to analog converters; hybrid MUXDAC devices; single event effects; spacecraft design; voltage converters; Analog-digital conversion; Circuit testing; Clocks; Design engineering; Digital-analog conversion; Electronic equipment testing; Performance evaluation; System testing; USA Councils; Voltage; Semiconductor device radiation effects;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2006 IEEE
Conference_Location
Ponte Vedra, FL
Print_ISBN
1-4244-0638-2
Type
conf
DOI
10.1109/REDW.2006.295466
Filename
4077280
Link To Document