Title :
Single Event Effects on New High Speed Analog to Digital Converters, Digital to Analog Converters, Hybrid MUXDAC Devices, and Voltage Converters
Author :
Esteban, A.J. ; Bogorad, A.L. ; Likar, J.J. ; Moyer, S.K. ; Herschitz, R.
Author_Institution :
Specialty Eng., Lockheed Martin Commercial Space Syst., Newton, PA
Abstract :
SEE testing of new devices revealed unexpected behavior that has potentially serious implications to spacecraft design. Previously unreported SET, SEFI, and clock upsets underscore the importance of testing in worst-case operating conditions representative of device applications
Keywords :
analogue-digital conversion; avionics; convertors; digital-analogue conversion; multiplexing equipment; radiation hardening (electronics); SEFI; SET; analog to digital converters; clock upsets; digital to analog converters; hybrid MUXDAC devices; single event effects; spacecraft design; voltage converters; Analog-digital conversion; Circuit testing; Clocks; Design engineering; Digital-analog conversion; Electronic equipment testing; Performance evaluation; System testing; USA Councils; Voltage; Semiconductor device radiation effects;
Conference_Titel :
Radiation Effects Data Workshop, 2006 IEEE
Conference_Location :
Ponte Vedra, FL
Print_ISBN :
1-4244-0638-2
DOI :
10.1109/REDW.2006.295466
