Title :
Effects of Radiation on Commercial Power Devices
Author :
Selva, Luis ; Becker, Heidi ; Chavez, Rosa ; Scheick, Leif
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
Abstract :
The effects of radiation on various commercial power devices are presented. The devices have proved to be very fragile to single event effects, with some of the devices actually succumbing to catastrophic SEE with protons
Keywords :
power semiconductor devices; radiation hardening (electronics); BJT; IGBT; commercial power devices; heavy ions; proton radiation; radiation effects; single event effects; Insulated gate bipolar transistors; Laboratories; MOSFETs; NASA; Propulsion; Protons; Space technology; Testing; Thyristors; Voltage; BJT; IGBT; heavy ions; protons; radiation; switch; transistor;
Conference_Titel :
Radiation Effects Data Workshop, 2006 IEEE
Conference_Location :
Ponte Vedra, FL
Print_ISBN :
1-4244-0638-2
DOI :
10.1109/REDW.2006.295468
