Title :
Total Ionizing Dose Testing of a RadHard-by-Design FET Driver in a 0.35μm Triple-Well Process
Author :
Hartwell, Mary ; Ryan, Kevin ; Netherton, Steve ; Milliken, Peter ; Kerwin, David
Author_Institution :
Semicustom Technol. Dev. Manager, Aeroflex Colorado Springs, Inc.
Abstract :
Total ionizing dose (TID) testing performed on a radhard-by-design FET Driver on a 0.35μm triple-well process demonstrated radiation hardness to 300Krad(Si). Triple-well isolation provides superior performance, multiple and negative power supplies capabilities for robust mixed signal ASICs
Keywords :
driver circuits; field effect integrated circuits; integrated circuit testing; mixed analogue-digital integrated circuits; radiation hardening (electronics); 0.35 micron; mixed signal ASIC; radhard-by-design FET driver; radiation hardness; total ionizing dose testing; triple-well isolation; triple-well process; Circuit testing; Driver circuits; FETs; MOSFETs; Manufacturing; Radiation hardening; Signal design; Space technology; Springs; Voltage; Application specific integrated circuits; Mixed analog-digital integrated circuits; Radiation hardening; Space vehicle electronics;
Conference_Titel :
Radiation Effects Data Workshop, 2006 IEEE
Conference_Location :
Ponte Vedra, FL
Print_ISBN :
1-4244-0638-2
DOI :
10.1109/REDW.2006.295474
