DocumentCode :
3334627
Title :
Progress and validation of Geant4 based radioactive decay simulation using the examples of Simbol-X and IXO
Author :
Hauf, S. ; Kuster, M. ; Pia, M.G. ; Bell, Z. ; Briel, U. ; Chipaux, R. ; Hoffmann, D.H.H. ; Kendziorra, E. ; Laurent, P. ; Strüder, L. ; Tenzer, C. ; Weidenspointner, G. ; Zoglauer, A.
Author_Institution :
Inst. fur Kernphys., Tech. Univ. Darmstadt, Darmstadt, Germany
fYear :
2009
fDate :
Oct. 24 2009-Nov. 1 2009
Firstpage :
2060
Lastpage :
2065
Abstract :
The anticipated high sensitivity and the science goals of the next generation X-ray space missions, like the International X-ray Observatory or Simbol-X, rely on a low instrumental background, which in turn requires optimized shielding concepts. We present Geant4 based simulation results on the IXO Wide Field Imager cosmic ray proton induced background in comparison with previous results obtained for the Simbol-X LED and HED focal plane detectors. Our results show that an improvement in mean differential background flux compared to actually operating X-ray observatories may be feasible with detectors based on DEPFET technology. In addition we present preliminary results concerning the validation of Geant4 based radioactive decay simulation in space applications as a part of the Nano5 project.
Keywords :
X-ray astronomy; X-ray detection; astronomical instruments; cosmic ray apparatus; focal planes; space research; DEPFET technology; Geant4 based radioactive decay simulation; HED focal plane detector; IXO Wide Field Imager; International X-ray Observatory; LED focal plane detector; Nano5 project; Simbol-X; X-ray space missions; cosmic ray proton induced background; mean differential background flux; Detectors; Instruments; Light emitting diodes; Observatories; Protons; Radioactive decay; Space missions; Space technology; X-ray detection; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
ISSN :
1095-7863
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2009.5402112
Filename :
5402112
Link To Document :
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