DocumentCode :
3334766
Title :
Analog Transients in the National VIP-10 and VIP-50 Process
Author :
Savage, M.W. ; Seiler, J.E. ; Dunham, G.W. ; Platteter, D.
Author_Institution :
NAVSEA Crane, IN
fYear :
2006
fDate :
38899
Firstpage :
160
Lastpage :
164
Abstract :
The ASET responses of several designs utilizing vertical structures on SOI were evaluated. The devices chosen were the LMH6654, LMH6654, and the LMP7711 operational amplifiers
Keywords :
analogue circuits; operational amplifiers; radiation effects; silicon-on-insulator; ASET responses; SOI; analog transients; heavy ion; national VIP-10 process; national VIP-50 Process; operational amplifiers; single event effects; Circuit testing; Cranes; FETs; Metallization; Operational amplifiers; Oscilloscopes; Pulse amplifiers; Relays; Tungsten; Voltage; ASET; SOI; heavy ion; single event effects;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation Effects Data Workshop, 2006 IEEE
Conference_Location :
Ponte Vedra, FL
Print_ISBN :
1-4244-0638-2
Type :
conf
DOI :
10.1109/REDW.2006.295486
Filename :
4077300
Link To Document :
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