AIM-Spice Integration of a Recursive Model for Threshold Voltage Shift in Thin Film Transistors

Author

Raghuraman, Mathangi ; Sambandan, Sanjiv

Author_Institution

Dept. of Instrum. & Appl. Phys., Indian Inst. of Sci., Bangalore, India

Volume

10

Issue

6

fYear

2014

fDate

Jun-14

Firstpage

508

Lastpage

513

Abstract

Non-crystalline semiconductor based thin film transistors are the building blocks of large area electronic systems. These devices experience a threshold voltage shift with time due to prolonged gate bias stress. In this paper we integrate a recursive model for threshold voltage shift with the open source BSIM4V4 model of AIM-Spice. This creates a tool for circuit simulation for TFTs. We demonstrate the integrity of the model using several test cases including display driver circuits.

Keywords

circuit simulation; semiconductor device models; thin film transistors; AIM-Spice integration; circuit simulation; display driver circuits; large area electronic systems; noncrystalline semiconductor based thin film transistors; open source BSIM4V4 model; prolonged gate bias stress; recursive model; threshold voltage shift; Acceleration; Integrated circuit modeling; Logic gates; MOSFET; Semiconductor device modeling; Thin film transistors; Threshold voltage; Simulations; thin-film transistors (TFTs); threshold voltage shift;

fLanguage

English

Journal_Title

Display Technology, Journal of

Publisher

ieee

ISSN

1551-319X

Type

jour

DOI

10.1109/JDT.2014.2308315

Filename

6747959