Title :
AIM-Spice Integration of a Recursive Model for Threshold Voltage Shift in Thin Film Transistors
Author :
Raghuraman, Mathangi ; Sambandan, Sanjiv
Author_Institution :
Dept. of Instrum. & Appl. Phys., Indian Inst. of Sci., Bangalore, India
Abstract :
Non-crystalline semiconductor based thin film transistors are the building blocks of large area electronic systems. These devices experience a threshold voltage shift with time due to prolonged gate bias stress. In this paper we integrate a recursive model for threshold voltage shift with the open source BSIM4V4 model of AIM-Spice. This creates a tool for circuit simulation for TFTs. We demonstrate the integrity of the model using several test cases including display driver circuits.
Keywords :
circuit simulation; semiconductor device models; thin film transistors; AIM-Spice integration; circuit simulation; display driver circuits; large area electronic systems; noncrystalline semiconductor based thin film transistors; open source BSIM4V4 model; prolonged gate bias stress; recursive model; threshold voltage shift; Acceleration; Integrated circuit modeling; Logic gates; MOSFET; Semiconductor device modeling; Thin film transistors; Threshold voltage; Simulations; thin-film transistors (TFTs); threshold voltage shift;
Journal_Title :
Display Technology, Journal of
DOI :
10.1109/JDT.2014.2308315
