• DocumentCode
    3335041
  • Title

    Investigation of an impedance based GTEM calibration factor

  • Author

    Berger, H. Stephen

  • Author_Institution
    Siemens Rolm Commun. Inc., Austin, TX, USA
  • fYear
    195
  • fDate
    14-18 Aug 195
  • Firstpage
    551
  • Lastpage
    556
  • Abstract
    Presents an investigation into a GTEM calibration factor based on the impedance measured at the cell port. The work begins with the comparison of radiated emissions measurements taken from GTEMs of two different sizes. A radiating source, which radiated on a 5 MHz line spacing, was used for this comparison. The resulting comparison led to the measurement of the impedance, both real and imaginary, at the port of each cell. What was discovered was that there is an impedance variation in each cell. From the viewpoint of the port this variation of impedance traces a curve which is roughly a damped sinusoidal wave. The period of the wave relates roughly to the length of each cell. The study presents and analyzes the differences in radiated emissions measurements made in two different sizes of GTEMs and OATS measurements. It then presents and analyzes the cell port impedance measurements. A beginning is made on relating these two sets of measurements. The relative similarity in the difference plots suggest that the same physical mechanism is involved and that a calibration factor can be developed for the GTEM using impedance measurements in the band from 30-200 MHz, and possibly higher
  • Keywords
    calibration; electric impedance; electromagnetic compatibility; test equipment; testing; 30 to 200 MHz; 5 MHz; HF; OATS measurement; VHF; cell port; damped sinusoidal wave; impedance based GTEM calibration factor; impedance variation; radiated emissions measurements; Calibration; Impedance measurement; Laboratories; Open area test sites; Performance evaluation; Product development; Size measurement; TEM cells; Testing; Volume measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1995. Symposium Record., 1995 IEEE International Symposium on
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-7803-3608-9
  • Type

    conf

  • DOI
    10.1109/ISEMC.1995.523619
  • Filename
    523619