DocumentCode :
3335095
Title :
Simulation and measurement of vacuum electron hop funnel IV characteristics and energy distribution
Author :
Lester, C. ; Browning, J. ; Matthews, L.
Author_Institution :
Boise State Univ., Boise, ID, USA
fYear :
2010
fDate :
20-24 June 2010
Firstpage :
1
Lastpage :
1
Abstract :
Summary form only given. Electron hop funnel devices can be used to collect and spatially average electron emission current from field emission arrays (FEAs). At high enough operating voltage, the funnels provide unity gain of the injected emission current, and the resulting beams can be more uniform than from typical FEAs. We are using these devices to develop microwave amplifiers using FEAs. In the work described here, hop funnels have been fabricated from Low Temperature Co-fired Ceramic (LTCC), and the electron energy distribution of the hop funnel electron beam, as well as the IV characteristics, have been measured. The data has been compared against simulation using the particle trajectory code Lorentz. Convergence of the code has been demonstrated for a number of different parameters and, from which, the base parameters were determined and have been used to generate the numerical simulation results for the IV curve and electron energy distribution of the hop funnel exit beam. The results of the simulation and measurement will be used to estimate the maximum secondary electron yield and the corresponding maximum energy of the electron secondary yield curve of LTCC.
Keywords :
ceramics; plasma devices; plasma diagnostics; plasma simulation; electron energy distribution; electron hop funnel device; field emission array; hop funnel electron beam; low temperature cofired ceramic; maximum secondary electron yield; microwave amplifier; numerical simulation; particle trajectory code Lorentz; spatially average electron emission current; vacuum electron hop funnel characteristics; Ceramics; Convergence of numerical methods; Electron beams; Electron emission; Elementary particle vacuum; Energy measurement; Microwave amplifiers; Microwave devices; Temperature distribution; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2010 Abstracts IEEE International Conference on
Conference_Location :
Norfolk, VA
ISSN :
0730-9244
Print_ISBN :
978-1-4244-5474-7
Electronic_ISBN :
0730-9244
Type :
conf
DOI :
10.1109/PLASMA.2010.5534350
Filename :
5534350
Link To Document :
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