Title :
An algebraic approach to test generation for sequential circuits
Author :
Lioy, A. ; Macii, E. ; Meo, A.R. ; Reorda, M. Sonza
Author_Institution :
Politecnico di Torino, Italy
Abstract :
The authors describe an algebraic algorithm for automatic test pattern generation for sequential circuits. Three innovative concepts have been introduced in order to reduce the computational time required for pattern generation. These are: firstly, circuit partitioning in fanout-free regions; then, computation of observability and excitability functions for state propagation and justification; and finally, assignment of an observability and an excitability order to each node of the decision tree, for fast test pattern detection of each fault
Keywords :
Boolean functions; automatic testing; logic testing; observability; sequential circuits; trees (mathematics); algebraic algorithm; automatic test pattern generation; circuit partitioning; computational time; decision tree; excitability functions; fanout-free regions; logic circuits; observability; sequential circuits; state propagation; Automatic test pattern generation; Circuit faults; Circuit testing; Decision trees; Electrical fault detection; Fault detection; Observability; Partitioning algorithms; Sequential analysis; Sequential circuits;
Conference_Titel :
VLSI, 1991. Proceedings., First Great Lakes Symposium on
Conference_Location :
Kalamazoo, MI
Print_ISBN :
0-8186-2170-2
DOI :
10.1109/GLSV.1991.143952
