• DocumentCode
    3335227
  • Title

    Effects of impurities and secondary phases on the performance of CdZnTe radiation detectors

  • Author

    Swain, Santosh K. ; Jones, Kelly A. ; Datta, Amlan ; Lynn, Kelvin G.

  • Author_Institution
    Center for Mater. Res., Washington State Univ., Pullman, WA, USA
  • fYear
    2009
  • fDate
    Oct. 24 2009-Nov. 1 2009
  • Firstpage
    2415
  • Lastpage
    2418
  • Abstract
    CdZnTe (10% Zn) crystals for nuclear radiation detectors were grown using modified vertical Bridgman growth technique. Analyses of the effects of impurities and secondary phases on the detector properties were performed. We have attempted to establish a correlation between total impurities and ¿¿e. Also presented are the effects of volume % of secondary phases on the CdZnTe detector performance. ¿¿e values of 1E-2 cm2/V have been obtained from ingots with lower volume % of Te secondary phases. However, no correlation was observed between the volume % of secondary phases and ¿¿e indicating that both impurities and secondary phases effect the ¿¿e value. Results documenting the simultaneous avoidance of impurities and secondary phases are presented. We have shown that post processing CdZnTe is an effective means of reducing volume % of secondary phases.
  • Keywords
    II-VI semiconductors; annealing; cadmium compounds; crystal growth from melt; impurity distribution; leakage currents; semiconductor counters; CdZnTe; CdZnTe processing; CdZnTe radiation detectors; impurity effects; modified vertical Bridgman growth technique; nuclear radiation detectors; secondary phase effects; Annealing; Gold; Kelvin; Performance analysis; Phase detection; Radiation detectors; Semiconductor impurities; Tellurium; Temperature; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-3961-4
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2009.5402149
  • Filename
    5402149