DocumentCode
3335227
Title
Effects of impurities and secondary phases on the performance of CdZnTe radiation detectors
Author
Swain, Santosh K. ; Jones, Kelly A. ; Datta, Amlan ; Lynn, Kelvin G.
Author_Institution
Center for Mater. Res., Washington State Univ., Pullman, WA, USA
fYear
2009
fDate
Oct. 24 2009-Nov. 1 2009
Firstpage
2415
Lastpage
2418
Abstract
CdZnTe (10% Zn) crystals for nuclear radiation detectors were grown using modified vertical Bridgman growth technique. Analyses of the effects of impurities and secondary phases on the detector properties were performed. We have attempted to establish a correlation between total impurities and ¿¿e. Also presented are the effects of volume % of secondary phases on the CdZnTe detector performance. ¿¿e values of 1E-2 cm2/V have been obtained from ingots with lower volume % of Te secondary phases. However, no correlation was observed between the volume % of secondary phases and ¿¿e indicating that both impurities and secondary phases effect the ¿¿e value. Results documenting the simultaneous avoidance of impurities and secondary phases are presented. We have shown that post processing CdZnTe is an effective means of reducing volume % of secondary phases.
Keywords
II-VI semiconductors; annealing; cadmium compounds; crystal growth from melt; impurity distribution; leakage currents; semiconductor counters; CdZnTe; CdZnTe processing; CdZnTe radiation detectors; impurity effects; modified vertical Bridgman growth technique; nuclear radiation detectors; secondary phase effects; Annealing; Gold; Kelvin; Performance analysis; Phase detection; Radiation detectors; Semiconductor impurities; Tellurium; Temperature; Zinc;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location
Orlando, FL
ISSN
1095-7863
Print_ISBN
978-1-4244-3961-4
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2009.5402149
Filename
5402149
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