DocumentCode :
3335335
Title :
AIDA: A 16-channel amplifier ASIC to read out the advanced implantation detector array for experiments in nuclear decay spectroscopy
Author :
Braga, Davide ; Coleman-Smith, Patrick J. ; Davinson, Thomas ; Lazarus, Ian H. ; Page, Robert D. ; Thomas, Stephen
Author_Institution :
Rutherford Appleton Lab., STFC, Didcot, UK
fYear :
2009
fDate :
Oct. 24 2009-Nov. 1 2009
Firstpage :
1924
Lastpage :
1928
Abstract :
We have designed a read-out ASIC for nuclear decay spectroscopy as part of the AIDA project - the Advanced Implantation Detector Array. AIDA will be installed in experiments at the Facility for Antiproton and Ion Research in GSI, Darmstadt. The AIDA ASIC will measure the signals when unstable nuclei are implanted into the detector, followed by the much smaller signals when the nuclei subsequently decay. Implant energies can be as high as 20 GeV; decay products need to be measured down to 25 keV within just a few microseconds of the initial implants. The ASIC uses two amplifiers per detector channel, one covering the 20 GeV dynamic range, the other selectable over a 20 MeV or 1 GeV range. The amplifiers are linked together by diodes and bypass transistors which are normally switched off. The arrival of a large signal causes saturation of the low-energy amplifier and a fluctuation of the input voltage, which forward biases the link diode to the high-energy amplifier. The bypass transistors switch on and the remainder of the charge is integrated by the high-energy amplifier. The signal is shaped and stored by a peak-hold, then read out on a multiplexed output. Control logic resets the amplifiers and bypass circuit, allowing the low-energy amplifier to measure the subsequent decay signal. We present simulations and test results, demonstrating the AIDA ASIC operation over a wide range of input signals.
Keywords :
application specific integrated circuits; nuclear electronics; readout electronics; transistor circuits; AIDA ASIC operation; advanced implantation detector array; amplifier application specific integrated circuits; bypass transistors; control logic; diodes; fluctuation; high-energy amplifier; input signals; nuclear decay spectroscopy; read out; Application specific integrated circuits; Detectors; Diodes; Dynamic range; Energy measurement; Implants; Nuclear measurements; Sensor arrays; Spectroscopy; Switches; ASIC; Nuclear Physics; Spectroscopy; front-end electronics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
ISSN :
1095-7863
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2009.5402153
Filename :
5402153
Link To Document :
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