• DocumentCode
    3335498
  • Title

    First results of the HICAM anger camera

  • Author

    Fiorini, C. ; Busca, P. ; Gola, A. ; Peloso, R. ; Abba, A. ; Geraci, A. ; Longoni, A. ; Padovini, G. ; Soltau, H. ; Hutton, B.F. ; Erlandsson, K. ; Bianchi, C. ; Poli, G.L. ; Pedretti, A. ; Perotti, F.

  • Author_Institution
    Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy
  • fYear
    2009
  • fDate
    Oct. 24 2009-Nov. 1 2009
  • Firstpage
    1891
  • Lastpage
    1893
  • Abstract
    We are developing a new Anger camera for nuclear imaging in the framework of the HICAM (HIgh resolution CAMera) project supported by European Community. The camera is foreseen to be employed in applications where high-position resolution (~ 1 mm intrinsic spatial resolution) and camera compactness are of primary concern. The camera is based on the use of monolithic arrays of Silicon Drift Detectors (SDDs), each one with a JFET integrated in the detector chip. In this work we present the results of the characterization of a first prototype of the camera (1/4 of the final expected active area), composed by 25 SDDs of 1 cm2 each in a 5×5 format. The module is read-out by a single 25-channels ASIC. The prototype of the camera is presented in this work together with the results of the gamma-ray imaging characterization.
  • Keywords
    application specific integrated circuits; gamma-ray detection; junction gate field effect transistors; nuclear electronics; readout electronics; silicon radiation detectors; solid scintillation detectors; 25-channels ASIC; European Community; HICAM Anger camera; HIgh resolution CAMera project; JFET; gamma-ray imaging characterization; nuclear imaging; read-out electronics; silicon drift detectors; Application specific integrated circuits; Cameras; Collimators; Detectors; Image resolution; Nuclear imaging; Optical imaging; Photodetectors; Prototypes; Spatial resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-3961-4
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2009.5402163
  • Filename
    5402163