Title :
Vertically integrated circuits at fermilab
Author :
Deptuch, Grzegorz ; Demarteau, Marcel ; Hoff, James ; Lipton, Ronald ; Shenai, Alpana ; Trimpl, Marcel ; Yarema, Raymond ; Zimmerman, Tom
Author_Institution :
Electr. Eng. Dept., Fermi Nat. Accel. Lab., Batavia, IL, USA
fDate :
Oct. 24 2009-Nov. 1 2009
Abstract :
The exploration of the vertically integrated circuits, also commonly known as 3D-IC technology, for applications in radiation detection started at Fermilab in 2006. This paper examines the opportunities that vertical integration offers by looking at various 3D designs that have been completed by Fermilab. The emphasis is on opportunities that are presented by through silicon vias (TSV), wafer and circuit thinning and finally fusion bonding techniques to replace conventional bump bonding. Early work by Fermilab has led to an international consortium for the development of 3D-IC circuits for High Energy Physics. The consortium has submitted over 25 different designs for the Fermilab organized MPW run organized for the first time.
Keywords :
bonding processes; integrated circuit bonding; nuclear electronics; silicon radiation detectors; 3D IC technology; Fermilab; High Energy Physics; MPW run; circuit thinning; fusion bonding technique; radiation detection; through silicon vias; vertically integrated circuits; wafer; Application specific integrated circuits; Fabrication; Integrated circuit technology; Laboratories; Microelectronics; Particle accelerators; Silicon; Three-dimensional integrated circuits; Through-silicon vias; Wafer bonding;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2009.5402167