Title :
Coverage-Based Testing on Embedded Systems
Author :
Wu, X. ; Li, J. Jenny ; Weiss, D. ; Lee, Y.
Author_Institution :
Arizona State Univ., Tempe
Abstract :
One major issue of code coverage testing is the overhead imposed by program instrumentation, which inserts probes into the program to monitor its execution. In real-time systems, the overhead may alter the program execution behavior or impact its performance due to its strict requirement on timing. Coverage testing is even harder on embedded systems because of their critical and limited memory and CPU resources. This paper describes a case study of a coverage-based testing method for embedded system software focusing on minimizing instrumentation overhead. We ported a code coverage-based test tool to an in-house embedded system, IP phone. In our initial experiments, we found that this tool didn ´t affect the behavior of the program under test.
Keywords :
embedded systems; program testing; code coverage testing; coverage-based testing; embedded systems; program execution behavior; program under test; real-time systems; Embedded software; Embedded system; Instruments; Monitoring; Probes; Real time systems; Software systems; Software testing; System testing; Timing;
Conference_Titel :
Automation of Software Test , 2007. AST '07. Second International Workshop on
Conference_Location :
Minneapolis, MN
Print_ISBN :
978-0-7695-2971-2