Title :
Kodak CCD-based detector for small angle X-ray scattering
Author :
Lee, Hok-ling ; Madden, Timothy ; Fernandez, Patricia ; Lee, Byeongdu ; Seifert, Soenke ; Weizeorick, John ; Molitsky, Michael
Author_Institution :
XSD of Adv. Photon Source, Argonne Nat. Lab., Argonne, IL, USA
fDate :
Oct. 24 2009-Nov. 1 2009
Abstract :
The Beamline Technical Support Group (BTS) at the Advanced Photon Source (APS) has developed two CCD detector systems (the Single and Quad Platinum systems), for X-ray diffraction and imaging experiments. Both of these systems, optimized for sensitivity toward X-ray photons, utilize the Kodak KAF-4320E CCD coupled to fiber-optic tapers, custom mechanical hardware, electronics, and software systems developed at the APS. Each CCD is composed of ~ 2k à 2k 25-¿m-sized pixels, providing a total active detector area of 168 mm à 168 mm. In fast mode with 4 à 4 binning, the Quad system can reach a rate of 5 frames per second (fps). The sensitivity of the detector has been enhanced by using tapers with low demagnification ratio (1.78) and CCDs with high quantum efficiency. The sensitivity, resolution, and dynamic range have made the detectors suitable for a wide range of synchrotron experiment, in particular, small-angle x-ray scattering (SAXS). SAXS data from the x-ray scattering of silver behenate powder have been used to demonstrate the performance of the detector.
Keywords :
X-ray detection; X-ray imaging; X-ray scattering; charge-coupled devices; position sensitive particle detectors; semiconductor counters; Kodak CCD-based detector; Kodak KAF-4320E CCD; Quad system; X-ray imaging; X-ray photons; advanced photon source; beamline technical support group; custom mechanical hardware; detector area; electronics; fiber-optic tapers; low demagnification ratio; quantum efficiency; silver behenate powder; small angle X-ray scattering; software systems; synchrotron experiment; Charge coupled devices; Hardware; Optical imaging; Platinum; Software systems; X-ray detection; X-ray detectors; X-ray diffraction; X-ray imaging; X-ray scattering;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2009.5402194