Title :
Planar non-volatile memory with single-electron channel fabricated on a hyper-thin SOI film
Author :
Uchida, K. ; Koga, J. ; Ohba, R. ; Takagi, S. ; Toriumi, A.
Author_Institution :
Adv. Semicond. Devices Res. Labs., Toshiba Corp., Yokohama, Japan
Abstract :
We have demonstrated the hyper-thin SOI memory device that has both conduction channel and storage islands at the lower gate voltage. It also shows both Coulomb staircase and oscillations at 20 K. By the use of coexistence of memory with Coulomb blockade effects, the Coulomb oscillation phase was well controlled. This will open a way to the robust nano-structure devices, including the functional devices for multi-value memory/logic.
Keywords :
Coulomb blockade; MOSFET; quantum interference devices; semiconductor storage; silicon-on-insulator; 20 K; Coulomb blockade; Coulomb oscillation; Coulomb staircase; MOSFET; hyper-thin SOI film; nanostructure device; planar non-volatile memory; quantum transport; single electron channel; Electrons; Hysteresis; Nanoscale devices; Nonvolatile memory; Robustness; Rough surfaces; Semiconductor films; Surface roughness; Surface treatment; Voltage;
Conference_Titel :
Device Research Conference Digest, 1999 57th Annual
Conference_Location :
Santa Barbara, CA, USA
Print_ISBN :
0-7803-5170-3
DOI :
10.1109/DRC.1999.806349