DocumentCode :
3336312
Title :
Planar non-volatile memory with single-electron channel fabricated on a hyper-thin SOI film
Author :
Uchida, K. ; Koga, J. ; Ohba, R. ; Takagi, S. ; Toriumi, A.
Author_Institution :
Adv. Semicond. Devices Res. Labs., Toshiba Corp., Yokohama, Japan
fYear :
1999
fDate :
23-23 June 1999
Firstpage :
138
Lastpage :
139
Abstract :
We have demonstrated the hyper-thin SOI memory device that has both conduction channel and storage islands at the lower gate voltage. It also shows both Coulomb staircase and oscillations at 20 K. By the use of coexistence of memory with Coulomb blockade effects, the Coulomb oscillation phase was well controlled. This will open a way to the robust nano-structure devices, including the functional devices for multi-value memory/logic.
Keywords :
Coulomb blockade; MOSFET; quantum interference devices; semiconductor storage; silicon-on-insulator; 20 K; Coulomb blockade; Coulomb oscillation; Coulomb staircase; MOSFET; hyper-thin SOI film; nanostructure device; planar non-volatile memory; quantum transport; single electron channel; Electrons; Hysteresis; Nanoscale devices; Nonvolatile memory; Robustness; Rough surfaces; Semiconductor films; Surface roughness; Surface treatment; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference Digest, 1999 57th Annual
Conference_Location :
Santa Barbara, CA, USA
Print_ISBN :
0-7803-5170-3
Type :
conf
DOI :
10.1109/DRC.1999.806349
Filename :
806349
Link To Document :
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