DocumentCode :
3336577
Title :
Development of the silicon photo-strip sensor
Author :
Kah, D.H. ; Bae, J.B. ; Hyun, H.J. ; Kim, H.J. ; Kim, H.O. ; Park, H.
Author_Institution :
Dept. of Phys., Kyungpook Nat. Univ., Daegu, South Korea
fYear :
2009
fDate :
Oct. 24 2009-Nov. 1 2009
Firstpage :
1730
Lastpage :
1733
Abstract :
We have designed and fabricated silicon photostrip sensors with polysilicon resistors and coupling capacitors. This developed detector consists of two photo-strip sensors sandwiching opposite faces of a crystal scintillator and being oriented orthogonal to each other. This configuration is able to provides the 2 dimensional position information and to measure the energy. Therefore they can be used in nuclear and medical application. The developed sensor has p+ strip array for signal readout. On the other hand, the rear side is a light entrance window which has very thin n+ doping layer with anti-reflective coating to prevent light losing. These sensors are fabricated on a 5-in., 380 ¿m-thickness, n-type, high resistivity silicon wafer. The leakage currents of the fabricated sensors are measured as a function of the reverse bias voltages. The light responses of fabricated silicon photosensors coupled with a CsI(Tl) crystal are measured by using 241Am, 22Na and 137Cs radioactive sources. The energy resolutions of the photodiode coupled with the crystal are obtained to be 20.5 % and 13.8 % for the 22Na (511 keV) and the 137Cs (662 keV) ¿-rays. The one-dimensional position information by the ¿ particles (241Am) are clearly observed by the photo-strip sensor coupled with the crystal.
Keywords :
caesium compounds; elemental semiconductors; photodetectors; position sensitive particle detectors; semiconductor devices; solid scintillation detectors; 1D position information; 2D position information; 137Cs radioactive source; 22Na radioactive source; 241Am radioactive source; CsI:Tl; Si; Tl doped CsI crystal; antireflective coating; coupling capacitors; crystal scintillator; leakage current; n-type high resistivity silicon wafer; n+ doping layer; p+ strip array; photodiode energy resolution; polysilicon resistors; silicon photostrip sensor; size 5 in; Capacitive sensors; Capacitors; Detectors; Energy measurement; Face detection; Medical services; Position measurement; Resistors; Sensor arrays; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
ISSN :
1095-7863
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2009.5402228
Filename :
5402228
Link To Document :
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