Title :
Automatic detection of epileptiform activity using wavelet and expert rule base
Author :
Kim, Sae B. ; Lee, Yong H. ; Kim, Ju H. ; Kim, Sun I.
Author_Institution :
Dept. of Biomed. Eng., Hanyang Univ., Seoul, South Korea
fDate :
29 Oct-1 Nov 1998
Abstract :
We present a new method to detect epileptiform activity based on wavelet transform (WT), an artificial neural network and an expert rule system. The method consists of three steps. First, we extract features of spike events on the wavelet subspace. It appears technically feasible to reduce computational complexity. Then, the features are trained and tested to decide epileptic events with three layer feedforward networks employing the backpropagation (BP) learning algorithm. Finally, to confirm and validate epileptiform activity, we apply an expert system based on rule base. The result shows that the wavelet transform reduced data input size and the preprocessed artificial neural network (ANN) are more accurate than those of ANN with the same input size of raw data. In clinical tests, our expert system was capable of rejecting artifacts commonly found in EEG recordings
Keywords :
backpropagation; computational complexity; electroencephalography; feature extraction; feedforward neural nets; medical expert systems; medical signal processing; pattern classification; signal classification; wavelet transforms; EEG; artifacts rejection; artificial neural network; automatic detection; backpropagation; data input size; epileptiform activity; expert rule system; feature extraction; reduced computational complexity; spike events; three layer feedforward networks; wavelet subspace; wavelet transform; Artificial neural networks; Backpropagation algorithms; Computational complexity; Data preprocessing; Electroencephalography; Epilepsy; Expert systems; Feature extraction; System testing; Wavelet transforms;
Conference_Titel :
Engineering in Medicine and Biology Society, 1998. Proceedings of the 20th Annual International Conference of the IEEE
Conference_Location :
Hong Kong
Print_ISBN :
0-7803-5164-9
DOI :
10.1109/IEMBS.1998.747016