DocumentCode
333659
Title
Automatic detection of epileptiform activity using wavelet and expert rule base
Author
Kim, Sae B. ; Lee, Yong H. ; Kim, Ju H. ; Kim, Sun I.
Author_Institution
Dept. of Biomed. Eng., Hanyang Univ., Seoul, South Korea
Volume
4
fYear
1998
fDate
29 Oct-1 Nov 1998
Firstpage
2078
Abstract
We present a new method to detect epileptiform activity based on wavelet transform (WT), an artificial neural network and an expert rule system. The method consists of three steps. First, we extract features of spike events on the wavelet subspace. It appears technically feasible to reduce computational complexity. Then, the features are trained and tested to decide epileptic events with three layer feedforward networks employing the backpropagation (BP) learning algorithm. Finally, to confirm and validate epileptiform activity, we apply an expert system based on rule base. The result shows that the wavelet transform reduced data input size and the preprocessed artificial neural network (ANN) are more accurate than those of ANN with the same input size of raw data. In clinical tests, our expert system was capable of rejecting artifacts commonly found in EEG recordings
Keywords
backpropagation; computational complexity; electroencephalography; feature extraction; feedforward neural nets; medical expert systems; medical signal processing; pattern classification; signal classification; wavelet transforms; EEG; artifacts rejection; artificial neural network; automatic detection; backpropagation; data input size; epileptiform activity; expert rule system; feature extraction; reduced computational complexity; spike events; three layer feedforward networks; wavelet subspace; wavelet transform; Artificial neural networks; Backpropagation algorithms; Computational complexity; Data preprocessing; Electroencephalography; Epilepsy; Expert systems; Feature extraction; System testing; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 1998. Proceedings of the 20th Annual International Conference of the IEEE
Conference_Location
Hong Kong
ISSN
1094-687X
Print_ISBN
0-7803-5164-9
Type
conf
DOI
10.1109/IEMBS.1998.747016
Filename
747016
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