Title :
Online backlight unit tester based on area CCD
Author :
Wei, Tzu-Hsuan ; Wen, Jen-Yu ; Chiang, Wei-Chieh ; Tsai, Ruei-Hung ; Huang, Ting-Ming ; Tsay, Ho-Lin ; Liao, Tai-Shan
Author_Institution :
Nat. Appl. Res. Labs., Instrum. Technol. Res. Center, Taipei
Abstract :
Concept of using charge coupled device camera embedded with a calibrated image-processing algorithm as a two-dimensional luminance meter was successfully realized and verified with a small-scale backlight unit tester. This built apparatus takes only 3 seconds to get data of 10,000 points spreading uniformly in a 4-inches target, with target arbitrarily oriented. These merits make the tester more attractive and suitable for an online measurement system than other BLU testers based on area CCD.
Keywords :
CCD image sensors; brightness; charge-coupled devices; image processing; liquid crystal displays; optical variables measurement; CCD; charge coupled device camera; image-processing algorithm; luminance meter; online backlight unit tester; Area measurement; Cameras; Cathode ray tubes; Charge coupled devices; Charge-coupled image sensors; Flat panel displays; Liquid crystal displays; Manufacturing; Monitoring; System testing; AOI; CCD; backlight unit;
Conference_Titel :
Smart Manufacturing Application, 2008. ICSMA 2008. International Conference on
Conference_Location :
Gyeonggi-do
Print_ISBN :
978-89-950038-8-6
Electronic_ISBN :
978-89-962150-0-4
DOI :
10.1109/ICSMA.2008.4505574
