Title :
TRAPPISTe Pixel Sensor with 2μm SOI technology
Author :
Martin, Elena ; Cortina, Eduardo ; Yee, Lawrence Soung ; Renaux, Christian ; Flandre, Denis
Author_Institution :
CP3 Center for Particle Phys. & Phenomenology, Univ. Catholique de Louvain, Louvain-la-Neuve, Belgium
fDate :
Oct. 24 2009-Nov. 1 2009
Abstract :
TRAPPISTe-1 (Tracking Particle for Physics Instrumentation in SOI Technology) is a R&D project for the study of the feasibility to build a Monolithic Active Pixel Sensor (MAPS) with Silicon On Insulator (SOI). In this paper we present the first prototype of this series of sensors. This first prototype has been build with a 2 μm technology in Electronic Engineer Department SOI production facility in Louvain-la-Neuve. Also additional measurements of a SOI diode detector have been performed, which has been fabricated usign the same technology process, to study the different bias possibilities in order to decrease the strength of back gate effect.
Keywords :
monolithic integrated circuits; readout electronics; semiconductor counters; silicon-on-insulator; MAPS; SOI diode detector; SOI technology; TRAPPISTe pixel sensor; Tracking Particle for Physics Instrumentation in SOI Technology; back gate effect; monolithic active pixel sensor; silicon on insulator technology; Design engineering; Envelope detectors; Instruments; Insulation life; Particle tracking; Performance evaluation; Physics; Production facilities; Prototypes; Silicon on insulator technology; SOI; back gate effect; detector; pixel;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2009.5402237