Title :
Ultrasonic scatterer structure classification with the generalized spectrum
Author :
Donohue, Kevin D. ; Huang, Lexun
Author_Institution :
Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
Abstract :
Ultrasonic back-scattered shoes resulting from the structures within a scanned object contain information of potential diagnostic value. The most common nondestructive evaluation (NDE) techniques use large-scale changes in the back-scatterer coefficients to reveal boundaries between materials with different density/elasticity properties or defects in homogenous material regions. Less common techniques consider small-scale scatterer characteristics that give rise to textures and other features not readily seen in the A-scan envelope or intensity image. This paper considers applying the generalized spectrum (GS) for classifying small-scale scatterer structures into three broad categories, diffuse, specular, and regular. The GS distinguishes between stationary (diffusion scattering) and certain classes of nonstationary processes based on a statistical characterization of the phase spectrum, and the GS can be normalized to limit variations due to frequency selectivity of the scatterers and the ultrasonic propagation path. This paper explains how the GS can be applied to classify scatterer structures over small sections of the ultrasonic A-scan and demonstrates its classification performance with simulations. The significance of the approach to NDE applications, such as flaw detection in homogenous material and material characterization in more complex material, is also discussed
Keywords :
backscatter; electromagnetic wave scattering; flaw detection; spectral analysis; statistical analysis; ultrasonic materials testing; ultrasonic propagation; NDE techniques; back-scattered shoes; diffusion scattering; flaw detection; generalized spectrum; homogenous material; nondestructive evaluation; nonstationary processes; phase spectrum; regular scattering; small-scale scatterer structures; specular scattering; statistical characterization; structure classification; ultrasonic propagation path; ultrasonic scatterer; Elasticity; Energy resolution; Frequency; Inspection; Large-scale systems; Material properties; Random processes; Scattering parameters; Signal resolution; Ultrasonic transducers;
Conference_Titel :
Acoustics, Speech, and Signal Processing, 2001. Proceedings. (ICASSP '01). 2001 IEEE International Conference on
Conference_Location :
Salt Lake City, UT
Print_ISBN :
0-7803-7041-4
DOI :
10.1109/ICASSP.2001.940571