• DocumentCode
    3336856
  • Title

    Study on effect of charge sharing events in common-grid pixelated CdZnTe detectors

  • Author

    Kim, Jae Cheon ; Anderson, Stephen E. ; Kaye, Willy ; Kaye, Sonal Joshi ; Zhu, Yuefeng ; Zhang, Feng ; He, Zhong

  • Author_Institution
    Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA
  • fYear
    2009
  • fDate
    Oct. 24 2009-Nov. 1 2009
  • Firstpage
    1640
  • Lastpage
    1646
  • Abstract
    Due to the steering grid that aids the collection of electrons by the anode pixels, the common-grid pixelated CdZnTe (CZT) detectors have demonstrated better performance than simple pixel detectors. For a detailed analysis of charge sharing and weighting potential cross-talk that occurs near and underneath the gap and energy resolution degradation in common-grid CZT detectors, a detailed detector system modeling package has been developed and a related experiment using a sub-pixel interaction position estimation method has been performed. A 20×20×15 mm3 CZT crystal with an 11×11 common-grid pixel anode array with a 1.72 mm pixel pitch was modeled. The VAS_UM/TAT4 chip is used for ASIC readout. Through system modeling and measurement, the energy resolution degradation and system properties of common-grid CZT detectors has been studied quantitatively.
  • Keywords
    application specific integrated circuits; cadmium compounds; modelling; position sensitive particle detectors; readout electronics; semiconductor counters; ASIC readout; CdZnTe; CdZnTe detectors; VAS_UM-TAT4 chip; charge sharing effects; common grid pixelated CZT detectors; detector system modeling package; interaction position estimation method; size 15 mm; size 20 mm; steering grid; weighting potential cross talk; Anodes; Application specific integrated circuits; Degradation; Detectors; Electrons; Energy resolution; Event detection; Modeling; Packaging; Performance analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-3961-4
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2009.5402243
  • Filename
    5402243