DocumentCode :
3336877
Title :
Towards totally self-checking delay-insensitive systems
Author :
Piestrak, S.J. ; Nanya, T.
Author_Institution :
Inst. of Eng. Cybern., Tech. Univ. Wroclaw, Poland
fYear :
1995
fDate :
27-30 June 1995
Firstpage :
228
Lastpage :
237
Abstract :
Considers designing quasi-delay-insensitive (QDI) combinational circuits (CCs), a class of self-timed (asynchronous) circuits. The necessity of coding both inputs and outputs of any QDI CC by using unordered codes naturally leads to inverter-free realization. The analysis of behavior of a QDI CC with input errors leads to the observation that it is impossible to avoid the so-called late detection problem. The new set of correct definitions of the code-disjoint QDI CC and of the totally self-checking (TSC) QDI CC is introduced. The detailed analysis of the behavior of a faulty QDI system with internal permanent faults shows that: (1) late detection, (2) the possibility of occurrence of invalid transitions, and (3) premature completion, seem to be the inherent properties of any QDI CC, which preclude its fault-secure (hence TSC) implementation for some single stuck-at faults. The first ever self-testing code-disjoint completion checker is proposed. Finally, an extensive study of designing self-testing code-disjoint QDI CCs is presented.<>
Keywords :
codes; combinational circuits; delays; encoding; fault diagnosis; logic testing; asynchronous circuits; circuit design; code-disjoint circuit; fault-secure implementation; faulty system behaviour; input coding; input errors; internal permanent faults; invalid transitions; inverter-free realization; late detection problem; output coding; premature completion; quasi-delay-insensitive combinational circuits; self-testing code-disjoint completion checker; self-timed circuits; stuck-at faults; totally self-checking delay-insensitive systems; unordered codes; Built-in self-test; Circuit faults; Clocks; Computer science; Cybernetics; Delay systems; Electrical fault detection; Fault detection; Logic gates; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Fault-Tolerant Computing, 1995. FTCS-25. Digest of Papers., Twenty-Fifth International Symposium on
Conference_Location :
Pasadena, CA, USA
Print_ISBN :
0-8186-7079-7
Type :
conf
DOI :
10.1109/FTCS.1995.466975
Filename :
466975
Link To Document :
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