Title :
Theoretical energy calibration of multiple-pixel events in a wide band-gap semiconductor detector with pixellated electrodes
Author :
Boucher, Yvan A. ; He, Zhong ; Zhang, Feng
Author_Institution :
Univ. of Michigan, Ann Arbor, MI, USA
fDate :
Oct. 24 2009-Nov. 1 2009
Abstract :
The observed energy resolution of pixellated wide band-gap semiconductor detectors degrades as the number of triggered pixels increases. For multiple pixel events, one of the biggest barriers to overcome during the energy reconstruction is the effects of weighting potential cross-talk. The current calibration method determines a set of correction coefficients to convert each measured signal to an estimated energy deposition as a function of lateral separation between the interaction pixels and their centroid interaction depth. Theoretically, an energy calibration procedure can be implemented that will correct for weighting potential cross-talk as a function of the individual interaction depths and lateral pixel separation, as well as variation of amplifier gain for different pixel electrodes. An analysis of this theoretical calibration has been performed to better understand characteristics of this energy reconstruction method. This paper describes the results using actual measured data on the linear relationship between multiple-pixel anode signals.
Keywords :
calibration; calorimeters; energy measurement; photodetectors; semiconductor devices; wide band gap semiconductors; centroid multiple-pixel anode signals; different pixel electrodes; energy deposition; energy reconstruction; multiple-pixel events; pixellated wide band-gap semiconductor detector; theoretical energy calibration; weighting potential cross-talk; Calibration; Current measurement; Degradation; Detectors; Electrodes; Energy measurement; Energy resolution; Event detection; Performance analysis; Wide band gap semiconductors;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2009.5402257