Title :
Unsupervised identification of event-related brain potentials via competitive learning
Author :
Lange, Daniel H. ; Inbar, Gideon F. ; Pratt, Hillel ; Siegelmann, Hava T.
Author_Institution :
Dept. of Electr. Eng., Israel Inst. of Technol., Haifa, Israel
fDate :
29 Oct-1 Nov 1998
Abstract :
We present a novel approach to the problem of Event-Related Potential (ERP) identification, based on a competitive Artificial Neural Net (ANN). Our approach dismisses the need for stimulus- or event-related selective averaging, thus avoiding conventional assumptions on response invariability. The identifier is applied to real event-related potential data recorded during a common odd-ball type paradigm. For the first time, within-session variable signal patterns are automatically identified dismissing the strong and limiting requirement of a-priori stimulus-related selective grouping of the recorded data. The results present new possibilities in ERP research
Keywords :
electroencephalography; medical signal processing; neural nets; pattern classification; unsupervised learning; waveform analysis; EEG; automatic identification; common odd-ball type paradigm; competitive ANN; competitive learning; event-related brain potentials; identification bias; matched filter bank classifier; pattern identification network; single layer structure; unsupervised identification; variable brain responses; variance; within-session variable signal patterns; Artificial neural networks; Electric potential; Electroencephalography; Enterprise resource planning; Fluctuations; Neurons; Pattern analysis; Signal analysis; Signal processing; Signal to noise ratio;
Conference_Titel :
Engineering in Medicine and Biology Society, 1998. Proceedings of the 20th Annual International Conference of the IEEE
Conference_Location :
Hong Kong
Print_ISBN :
0-7803-5164-9
DOI :
10.1109/IEMBS.1998.747124