• DocumentCode
    3337529
  • Title

    The CMS all silicon tracker simulation

  • Author

    Biasini, M. ; Cuplov, V.

  • Author_Institution
    INFN, Perugia, Italy
  • fYear
    2009
  • fDate
    Oct. 24 2009-Nov. 1 2009
  • Firstpage
    785
  • Lastpage
    788
  • Abstract
    The Compact Muon Solenoid (CMS) tracker detector is the world´s largest silicon detector with about 201 m2 of silicon strips detectors and 1 m2 of silicon pixel detectors. It contains 66 millions pixels and 10 million individual sensing strips. The quality of the physics analysis is highly correlated with the precision of the tracker detector simulation which is written on top of the GEANT4 and the CMS object-oriented framework. The hit position resolution in the tracker detector depends on the ability to correctly model the CMS tracker geometry, the signal digitization, calibration and inefficiency. In order to ensure high performance in track and vertex reconstruction, an accurate knowledge of the material budget is therefore necessary since the passive materials, involved in the readout, cooling or power systems, will create unwanted effects during the particle detection, such as multiple scattering, electron bremsstrahlung and photon conversion. In this paper, we present the CMS tracker simulation description. The simulation was validated by comparing its results with CMS cosmic data taken in fall 2008.
  • Keywords
    position sensitive particle detectors; silicon radiation detectors; GEANT4; compact muon solenoid tracker detector; electron bremsstrahlung; multiple scattering; object-oriented framework; photon conversion; power systems; sensing strips; silicon pixel detectors; silicon tracker simulation; tracker detector simulation; vertex reconstruction; Collision mitigation; Detectors; Mesons; Object oriented modeling; Physics; Power system modeling; Power system simulation; Silicon; Solenoids; Strips;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-3961-4
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2009.5402284
  • Filename
    5402284