DocumentCode :
333769
Title :
Time-frequency analysis of event-related brain potentials
Author :
Bianchi, A.M. ; Leocani, L. ; Mainardi, L.T. ; Comi, G. ; Cerutti, S.
Author_Institution :
Lab. of Biomed. Eng., S. Raffaele Hosp., Milano, Italy
Volume :
3
fYear :
1998
fDate :
29 Oct-1 Nov 1998
Firstpage :
1486
Abstract :
The event related potentials recorded before, during and after the voluntary movement of a finger, contain relevant information regarding the nervous mechanism involved at central level. As the phenomena of interest take place in short time, the frequency information was obtained from the signal by means of a recursive implementation of a bivariate autoregressive (AR) model. The spectral and cross-spectral parameters have been calculated in correspondence of each sample in the signal and for each recording electrode in the 10-20 system. The time course of the power in different frequency bands was obtained together with coherence and phase relationships. The algorithm allowed the evaluation of the time instant in which the events of interest take place, evidencing the beginning and the end of event related desynchronization and event related synchronization giving a global insight into the observed phenomena
Keywords :
autoregressive processes; bioelectric potentials; electroencephalography; medical signal processing; spectral analysis; time-frequency analysis; EEG; bivariate autoregressive model; coherence relationships; cross-spectral parameters; event related desynchronization; event related synchronization; event-related brain potentials; multivariate analysis; nervous mechanism; phase relationships; recursive implementation; spectral parameters; time-frequency analysis; voluntary finger movement; Biomedical engineering; Brain modeling; Electrodes; Electroencephalography; Frequency synchronization; Hospitals; Predictive models; Rhythm; Signal analysis; Time frequency analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 1998. Proceedings of the 20th Annual International Conference of the IEEE
Conference_Location :
Hong Kong
ISSN :
1094-687X
Print_ISBN :
0-7803-5164-9
Type :
conf
DOI :
10.1109/IEMBS.1998.747167
Filename :
747167
Link To Document :
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