• DocumentCode
    3337729
  • Title

    Spread E, F layer ionospheric clutter identification in range-Doppler map for HFSWR

  • Author

    Li, Yang ; Zhang, Ning ; Yang, Qiang

  • Author_Institution
    Inst. of Electron. Eng. Technol., Harbin Inst. of Technol., Harbin, China
  • fYear
    2010
  • fDate
    26-29 Sept. 2010
  • Firstpage
    1397
  • Lastpage
    1400
  • Abstract
    Wide range covering, strong intensity, time-variant, fluctuation and irregular distribution of the spread E, F layer ionospheric clutter badly affects the system performance of High Frequency Surface Wave Radar (HFSWR). A spread E, F layer ionospheric clutter identification method is proposed based on the region segmentation results and region characteristics of the clutter. First of all, convolution template is used for locating the edge of the clutter, then the ratio of the number of the samples belonging to some segmented region and the total number of the samples in the region of interest (ROI) is used for setting the determinative threshold of the clutter region. Experiments with real data manifest that the proposed method can describe the effect of the spread ionospheric clutter to HFSWR. The quantitative analysis is consistent with the real data observation. The result can be used as a worthwhile reference for clutter mitigation, carrier frequency selection or radar system evaluation.
  • Keywords
    Doppler shift; F-region; edge detection; geophysical image processing; image segmentation; ionospheric techniques; radar clutter; radar imaging; HFSWR; ROI; edge location; high frequency surface wave radar; range-Doppler map; region of interest; region segmentation; spread E layer ionospheric clutter identification; spread F layer ionospheric clutter identification; Clutter; Doppler effect; Radar clutter; Sea surface; Silicon carbide; Surface waves; HF surface wave radar; clutter region segmentation; ionospheric clutter identification; spread ionospheric clutter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2010 17th IEEE International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-7992-4
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2010.5651714
  • Filename
    5651714