• DocumentCode
    3337761
  • Title

    Probability distribution and noise factor of solid state photomultiplier signals with cross-talk and afterpulsing

  • Author

    Vinogradov, S. ; Vinogradova, T. ; Shubin, V. ; Shushakov, D. ; Sitarsky, K.

  • Author_Institution
    Amplification Technol., Inc., Brooklyn, NY, USA
  • fYear
    2009
  • fDate
    Oct. 24 2009-Nov. 1 2009
  • Firstpage
    1496
  • Lastpage
    1500
  • Abstract
    Operating principles of Solid State Photomultipliers are based on Geiger mode avalanche breakdown limited by strong negative feedback. This operating mode provides both high gain and ultra-low excess noise of avalanche multiplication resulting in ability to detect single photons. On the other hand high gain is accompanied with cross-talk and afterpulsing processes changing the probability distribution function of output signals and arising specific excess noise. There are many reports regarding its influence on signal distribution and noise, and we suggest that some analytical expressions would be useful. We therefore are presenting a simple model of probability distribution of output signals in the presence of cross-talk and afterpulsing (namely compound Poisson distribution). The model results allow us to calculate excess noise factor of cross-talk and afterpulsing as well as to find simple way to measure its probabilities.
  • Keywords
    Geiger counters; photomultipliers; probability; Geiger mode avalanche breakdown; afterpulsing; avalanche multiplication; compound Poisson distribution; cross-talk; negative feedback; noise factor; probability distribution; probability distribution function; solid state photomultiplier signals; Avalanche breakdown; Crosstalk; Delay; Histograms; Negative feedback; Photodetectors; Photomultipliers; Probability distribution; Signal processing; Solid state circuits; Afterpulsing; Crosstalk; Noise Factor; Probability Distribution; Solid State Photomultipliers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-3961-4
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2009.5402300
  • Filename
    5402300