Title :
Predicting Fault Proneness of Classes Trough a Multiobjective Particle Swarm Optimization Algorithm
Author :
de Carvalho, Andre B ; Pozo, Aurora ; Vergilio, Silvia ; Lenz, Alexandre
Author_Institution :
Fed. Univ. of Parana, Curitiba
Abstract :
Software testing is a fundamental software engineering activity for quality assurance that is also traditionally very expensive. To reduce efforts of testing strategies, some design metrics have been used to predict the fault-proneness of a software class or module. Recent works have explored the use of machine learning (ML) techniques for fault prediction. However most used ML techniques can not deal with unbalanced data and their results usually have a difficult interpretation. Because of this, this paper introduces a multi-objective particle swarm optimization (MOPSO) algorithm for fault prediction. It allows the creation of classifiers composed by rules with specific properties by exploring Pareto dominance concepts. These rules are more intuitive and easier to understand because they can be interpreted independently one of each other. Furthermore, an experiment using the approach is presented and the results are compared to the other techniques explored in the area.
Keywords :
Pareto optimisation; learning (artificial intelligence); object-oriented programming; particle swarm optimisation; program diagnostics; program testing; quality assurance; software metrics; software quality; Pareto dominance concept; design metrics; fault-proneness prediction; machine learning; multiobjective particle swarm optimization algorithm; quality assurance; software class; software engineering; software testing; Bayesian methods; Costs; Machine learning; Machine learning algorithms; Object oriented modeling; Particle swarm optimization; Quality assurance; Software engineering; Software testing; Support vector machines; Fault prediction; Multiobjective Optimization; Particle Swarm Optimization; Software mining;
Conference_Titel :
Tools with Artificial Intelligence, 2008. ICTAI '08. 20th IEEE International Conference on
Conference_Location :
Dayton, OH
Print_ISBN :
978-0-7695-3440-4
DOI :
10.1109/ICTAI.2008.76