DocumentCode
3337877
Title
Application of wavelet transform on hyperspectral reflectance for soybean lai estimation in the songnen plain, China
Author
Dongmei, Lu ; Song, Kaishan ; Wang, Zongming ; Du, Jia ; Zeng, Lihong ; Lei, Xiaochun
Author_Institution
Comput. Sci. & Eng. Coll., JLIAE, Changchun, China
fYear
2010
fDate
25-30 July 2010
Firstpage
2139
Lastpage
2142
Abstract
In this study, we present spectral measurements of soybean LAI and their estimation from reflectance spectra data in Songnen Plain. Soybean canopy reflectance and its derivative were subsequently used in a linear regression analysis against LAI on one by one spectral reflectance. It was found that determination coefficient for LAI was high in blue, red and near infrared spectral region, and it was low in green spectral region, however LAI obtained its high determination coefficient in blue, green and red edge spectral region, especially in red edge region. Regression models were established based upon spectral vegetation indices and wavelet energy coefficient. It was found that wavelet transforms is an effective method for hyperspectral reflectance variables extraction to retrieve LAI, and the best multivariable regressions R2 up to 0.90 for LAI. Further studies are still needed to refine the methods for determining and estimating corn bio-physical/chemical parameters or other physiological parameters of different vegetation as well in the future.
Keywords
agriculture; crops; geophysical signal processing; regression analysis; remote sensing; wavelet transforms; China; Songnen plain; hyperspectral reflectance; linear regression analysis; multivariable regression; reflectance spectra data; regression models; soybean LAI estimation; soybean LAI spectral measurements; soybean canopy reflectance; spectral vegetation index; wavelet energy coefficient; wavelet transform; Feature extraction; Hyperspectral imaging; Reflectivity; Wavelet transforms; Hyperspectral; LAI; Wavelet Transform;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
Conference_Location
Honolulu, HI
ISSN
2153-6996
Print_ISBN
978-1-4244-9565-8
Electronic_ISBN
2153-6996
Type
conf
DOI
10.1109/IGARSS.2010.5651723
Filename
5651723
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