DocumentCode
333788
Title
Discriminating at-risk post-MI patients by fractal dimension analysis of the late potential attractor
Author
Mitchell, R.H. ; Escalona, O.
Author_Institution
Ulster Univ., Jordanstown, UK
Volume
3
fYear
1998
fDate
29 Oct-1 Nov 1998
Firstpage
1573
Abstract
A novel and reliable approach which quantifies the degree of complexity of late potential (LP) activity in the time domain is presented. By defining the LP attractor in the microvoltage, 3-dimensional space, and then computing the fractal dimension (δ) of the attractor´s trajectory, the degree of complexity of LP can be quantified with a single parameter. δ may indicate the chaotic behaviour of the terminal activity of the ventricular depolarisation process. The fractal dimension of the LP Attractor in post-MI subjects that are at risk is significantly higher than in post-MI subjects with low LP activity (p<0.001). δ may be considered as the criterion for discrimination. Fractal dimension analysis on LP is a novel diagnostic approach aimed at quantifying their complexity in the microvoltage 3-D space, and may be interpreted as a measure of their chaotic behaviour triggering a catastrophic arrhythmic episode
Keywords
bioelectric potentials; chaos; electrocardiography; filtering theory; fractals; medical signal detection; medical signal processing; phase space methods; at-risk post-MI patients discrimination; catastrophic arrhythmic episode; degree of complexity; deterministic chaos; fractal dimension analysis; high-pass filtering; late potential activity; late potential attractor; microvoltage 3D space; myocardial infarct; phase space; single parameter; terminal activity; time domain; ventricular depolarisation process; Chaos; Delay; Electrocardiography; Extraterrestrial measurements; Fractals; Frequency; H infinity control; Signal analysis; Size measurement; Stochastic processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 1998. Proceedings of the 20th Annual International Conference of the IEEE
Conference_Location
Hong Kong
ISSN
1094-687X
Print_ISBN
0-7803-5164-9
Type
conf
DOI
10.1109/IEMBS.1998.747193
Filename
747193
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