• DocumentCode
    3337892
  • Title

    The use of low voltage current limiting fuses to reduce arc flash energy

  • Author

    Doughty, Richard L. ; Neal, Thomas E. ; Macalady, Terry ; Saporita, Vince ; Borgwald, Kenneth

  • Author_Institution
    DuPont Eng., Wilmington, DE, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    371
  • Lastpage
    380
  • Abstract
    Current-limiting fuses, in their current-limiting range, reduce the available short circuit current and clear faults in one-half cycle or less. Available fuse test data, such as let-through l2t and peak let-through current, is based upon single-phase bolted-fault tests at full voltage. Currently there is no data available that relates single-phase current-limiting fuse test data with energy released by downstream three-phase arcs. A three-phase 600 V test program was conducted using Class L and RK1 fuses to determine the let-through arc energy and the incident energy produced 18 inches away from a 3-phase arc in a 20 inch cubic box. Incident energy produced by the downstream arc is correlated with the degree of current limitation and fuse bolted-fault test data. The benefit provided by current-limiting fuses in reducing arc flash energy is quantified
  • Keywords
    arcs (electric); electric fuses; short-circuit currents; testing; 18 in; 20 in; 600 V; Class L fuses; RK1 fuses; arc flash energy reduction; cubic box; current limitation; downstream three-phase arcs; fuse test data; incident energy; let-through arc energy; let-through l2t; low voltage current limiting fuses; peak let-through current; short circuit current; single-phase bolted-fault tests; single-phase current-limiting fuse test data; Circuit faults; Circuit testing; Current limiters; Fuses; Low voltage; Manufacturing; Performance evaluation; Power distribution; Power engineering and energy; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Petroleum and Chemical Industry Conference, 1999. Industry Applications Society 46th Annual
  • Conference_Location
    San Diego, CA
  • ISSN
    0090-3507
  • Print_ISBN
    0-7803-5601-2
  • Type

    conf

  • DOI
    10.1109/PCICON.1999.806456
  • Filename
    806456