Title :
Data storage in ferroelectrical films by near-field optical probe
Author :
Xu, Yongchen ; Pelzl, Josef
Author_Institution :
Pohl Inst. of Solid State Phys., Tongji Univ., Shanghai, China
Abstract :
We suggest that a near-field optical probe be used to store data in ferroelectric films. The near-field optical probe has a light focusing effect, the focused spot being as small as the subnanometer scale depending on the apex size of the probe. It is not limited by the diffraction principle. The data storage rate increases by at least 20 times. This is near the scale of the smallest ferroelectric domain in the films
Keywords :
barium compounds; dielectric polarisation; electric domains; ferroelectric storage; ferroelectric thin films; optical focusing; optical microscopy; optical storage; strontium compounds; BaSrTiO3; data storage; ferroelectric films; film polarization; focused spot; light focusing effect; near-field optical probe; smallest ferroelectric domain; subnanometer scale; Doping; Ferroelectric films; Hysteresis; Memory; Optical films; Optical microscopy; Polarization; Probes; Temperature; Transistors;
Conference_Titel :
Electrets, 1996. (ISE 9), 9th International Symposium on
Conference_Location :
Shanghai
Print_ISBN :
0-7803-2695-4
DOI :
10.1109/ISE.1996.578111
