Title :
Twelfth Annual IEEE International ASIC/SOC Conference (Cat. No.99TH8454)
Abstract :
Presents the front cover of the proceedings.
Keywords :
VLSI; application specific integrated circuits; digital signal processing chips; image sensors; industrial property; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; integrated circuit testing; logic CAD; logic testing; mixed analogue-digital integrated circuits; ASIC applications; DSP; IP; SoC applications; SoC design; SoC verification; behavioural synthesis; deep sub-micron technology; image sensors; interconnect modelling; logic synthesis; mixed-signal design; physical design; signal integrity; test strategies;
Conference_Titel :
ASIC/SOC Conference, 1999. Proceedings. Twelfth Annual IEEE International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5632-2
DOI :
10.1109/ASIC.1999.806457
