DocumentCode
3337916
Title
Clustering Inside Classes Improves Performance of Linear Classifiers
Author
Fradkin, Dmitriy
Author_Institution
Siemens Corp. Res., Princeton, NJ
Volume
2
fYear
2008
fDate
3-5 Nov. 2008
Firstpage
439
Lastpage
442
Abstract
This work systematically examines a Clustering Inside Classes (CIC) approach to classification. In CIC, each class is partitioned into subclasses based on cluster analysis. We find that CIC, by extracting local structure and producing compact subclasses, can improve performance of linear classifiers such as SVM and logistic regression. It is compared against a global classifier on four benchmark datasets. We empirically analyze effects of the training set size and the number of clusters per class on the results of the CIC approach. We also examine use of an automated method for selecting the number of clusters for each class.
Keywords
pattern classification; pattern clustering; SVM; cluster analysis; clustering inside classes approach; linear classifiers; logistic regression; Artificial intelligence; Clustering algorithms; Data analysis; Educational institutions; Logistics; Partitioning algorithms; Shape; Support vector machine classification; Support vector machines; SVM; classification; cluster analysis; logistic regression;
fLanguage
English
Publisher
ieee
Conference_Titel
Tools with Artificial Intelligence, 2008. ICTAI '08. 20th IEEE International Conference on
Conference_Location
Dayton, OH
ISSN
1082-3409
Print_ISBN
978-0-7695-3440-4
Type
conf
DOI
10.1109/ICTAI.2008.29
Filename
4669806
Link To Document