• DocumentCode
    3337916
  • Title

    Clustering Inside Classes Improves Performance of Linear Classifiers

  • Author

    Fradkin, Dmitriy

  • Author_Institution
    Siemens Corp. Res., Princeton, NJ
  • Volume
    2
  • fYear
    2008
  • fDate
    3-5 Nov. 2008
  • Firstpage
    439
  • Lastpage
    442
  • Abstract
    This work systematically examines a Clustering Inside Classes (CIC) approach to classification. In CIC, each class is partitioned into subclasses based on cluster analysis. We find that CIC, by extracting local structure and producing compact subclasses, can improve performance of linear classifiers such as SVM and logistic regression. It is compared against a global classifier on four benchmark datasets. We empirically analyze effects of the training set size and the number of clusters per class on the results of the CIC approach. We also examine use of an automated method for selecting the number of clusters for each class.
  • Keywords
    pattern classification; pattern clustering; SVM; cluster analysis; clustering inside classes approach; linear classifiers; logistic regression; Artificial intelligence; Clustering algorithms; Data analysis; Educational institutions; Logistics; Partitioning algorithms; Shape; Support vector machine classification; Support vector machines; SVM; classification; cluster analysis; logistic regression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Tools with Artificial Intelligence, 2008. ICTAI '08. 20th IEEE International Conference on
  • Conference_Location
    Dayton, OH
  • ISSN
    1082-3409
  • Print_ISBN
    978-0-7695-3440-4
  • Type

    conf

  • DOI
    10.1109/ICTAI.2008.29
  • Filename
    4669806